Founded in 2015
The International Digital Image Correlation Society (iDICs), composed of members from academia, government, and industry, is committed to training and educating users of DIC systems and the standardization of DIC practice for general applications.
To support this mission, iDICs members develop and offer DIC certification programs that will be recognized world-wide and develop additional programs as appropriate to improve industry measurement techniques and practices for advanced DIC applications. iDICs also coordintes activities focused on DIC standards development.
November 2017, Barcelona, Spain
Join us for the annual meeting and workshop in Barcelona, Spain. Experience the latest DIC technology, get training on the leading DIC systems, and learn tips from other practitioners in the field. More details »
Events & Courses
Upcoming training events
To advertise your DIC event or course here, use the Contact Us link above to let us know about the event.
International Symposium on Optomechatronic Technology, Nov 5-9, 2017 in Tainan, Taiwan
International Conference on Composite Materials, (Special track on DIC) August 20-25, 2017 in Xian, China
PhotoMechanics, March 20-22, 2018 in Toulouse, FR
DIC is a non-contact means of measuring motion and deformation using digital images of the object of interest. It’s used for a wide variety of applications from characterizing material properties to identifying structural damage and quality testing in manufacturing.
iDICs 2016 Conference & Workshop Summary in Pictures
This year, over 200 people, from 13 countries participated in the 2016 iDICs Conference & Workshop in downtown Philadelphia, PA. Check out the summary of the event here.
DIC measurements underwater?
Prof. Shukla and his team of researchers at the University of Rhode Island are studying the dynamics of underwater implosion mechanics using stereo DIC.
Scanning electron microscopy and DIC
Adam Kammers and Sam Daly have tackled many of the distortions involved in SEM imaging leading to a DIC methodology for SEM with accurate results.
Can DIC break the Heisenberg limit?
This article by researchers in France delves into this heavily contested issue regarding the interplay between capturing a signal accurately and simultaneously, its motion.
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