Founded in 2015

The International Digital Image Correlation Society (iDICs), composed of members from academia, government, and industry, is committed to training and educating users of DIC systems and the standardization of DIC practice for general applications.

To support this mission, iDICs members develop and offer DIC certification programs that will be recognized world-wide and develop additional programs as appropriate to improve industry measurement techniques and practices for advanced DIC applications. iDICs also coordintes activities focused on DIC standards development.

iDICs 2019

October 2019, Portland, OR, USA

Join us for the annual meeting and workshop in Portland, Oregon, USA. Experience the latest DIC technology, get training on the leading DIC systems, and learn tips from other practitioners in the field. More details »

Events & Courses

Upcoming training events

To advertise your DIC event or course here, use the Contact Us link above to let us know about the event.

Upcoming Certification Dates:
Oct. 17th, 2019 – Level 1 Certification (during iDICs 2019 Conference & Workshop)

iDICs 2019 Conference & Workshop, DIC Courses

Einführung in die Digitale Bildkorrelation für Anwendungen bei der Charakterisierung von Faserverbundwerkstoffen, March 19th, 2020

GOM: ARAMIS Tech Day 2019



DIC-related positions available

Laboratory Manager with an emphasis on DIC experience at University of Virginia

DIC Postdoc at University of Louisiana at Lafayette


2019 iDICs Founder’s Award Recipients: Prof. Wolfgang Knauss and Dr. Guillaume Vendroux

The Founder’s Award within the International Digital Image Correlation Society (iDICs) is awarded to individuals who have made a pioneering contribution, either through a novel application of image correlation or development of methodologies that have significantly impacted the field. The Founder’s Award recipients for 2019 are Prof. Wolfgang Knauss and Dr. Guillaume Vendroux.

Published in three tightly coupled papers in Experimental Mechanics in 1998, their research studies included (a) construction of a novel high magnification scanning tunneling electron microscope (STEM) imaging system, (b) modification of image correlation algorithms to analyze the STEM images and (c) demonstration of the capabilities of the STEM system with image correlation to obtain deformation measurements. The work of the authors was so unique that it was more than a decade ahead of future image correlation applications using scanning electron microscope (SEM) images. In fact, publication of their contributions was exceedingly difficult due to the lack of reviewers with sufficient background to assess the breadth and depth of their contributions. Not only did the recipients construct a fully functional STEM system, but they also showed that the gradient algorithms used in image correlation matching could be simplified to speed up analyses without affecting accuracy of the results. Even today, over 20 years after their unique contributions were published, their first-ever studies remain a shining example of what motivated, outstanding investigators can achieve.

Chinese Translation of the Good Practices Guide Released

The Good Practices Guide for Digital Image Correlation has now been translated into Chinese. See the Guide page for more info or to download.

Guide »

What is digital image correlation (DIC)?

DIC is a non-contact means of measuring motion and deformation using digital images of the object of interest. It’s used for a wide variety of applications from characterizing material properties to identifying structural damage and quality testing in manufacturing.

Wikipedia article »
Experimental Techniques article series »

Featured DIC-related Publications

DIC measurements underwater?

Prof. Shukla and his team of researchers at the University of Rhode Island are studying the dynamics of underwater implosion mechanics using stereo DIC.

Read more »

Scanning electron microscopy and DIC

Adam Kammers and Sam Daly have tackled many of the distortions involved in SEM imaging leading to a DIC methodology for SEM with accurate results.

Read more »

Can DIC break the Heisenberg limit?

This article by researchers in France delves into this heavily contested issue regarding the interplay between capturing a signal accurately and simultaneously, its motion.

Read more »



Corporate Members

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Partnering Organizations

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